首页> 外国专利> GROWTH OF VERY UNIFORM SILICON CARBIDE EPITAXIAL LAYERS

GROWTH OF VERY UNIFORM SILICON CARBIDE EPITAXIAL LAYERS

机译:非常均匀的碳化硅外延层的生长

摘要

An improved chemical vapor deposition method is disclosed that increases the uniformity of silicon carbide epitaxial layers and that is particularly useful for obtaining thicker epitaxial layers. The method comprises heating a reactor to a temperature at which silicon carbide source gases will form an epitaxial layer of silicon carbide on a substrate in the reactor; and then directing a flow of source and carrier gases through the heated reactor to form an epitaxial layer of silicon carbide on the substrate with the carrier gases comprising a blend of hydrogen and a second gas in which the second gas has a thermal conductivity that is less than the thermal conductivity of hydrogen so that the source gases deplete less as they pass through the reactor than they would if hydrogen is used as the sole carrier gas.
机译:公开了一种改进的化学气相沉积方法,该方法增加了碳化硅外延层的均匀性,并且对于获得较厚的外延层特别有用。该方法包括将反应器加热到一定温度,在该温度下,碳化硅源气体将在反应器中的衬底上形成碳化硅的外延层。然后引导源气流和载气流通过加热的反应器,以在衬底上形成碳化硅外延层,其中载气包含氢和第二种气体的混合物,其中第二种气体的导热系数小于氢的导热率要比氢的导热率低,因此与通过氢气作为唯一载气相比,通过反应器时的源气体消耗更少。

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