COMBINED DEVICE FOR X-ray diffraction and X-ray measurements (OPTIONS)

摘要

The apparatus allows to study the elemental and phase compositions of crystalline and amorphous materials in the form of powders, wires, plates, micro-objects by simultaneously recording the spectra of X-ray diffraction and X-ray fluorescence coordinate-sensitive (14) and energy dispersive (15) detectors when exposed to a sample of X-ray radiation collimated beam tube (7). The detector (15) is arranged outside the registration ray diffraction angle range detector (14). In the first embodiment (Figure 2) a base for mounting a sample in the form of a support disc (16) is rigidly connected to the outer casing (1) Reasons for the placement of X-ray source (2), the detector (14) and (15) are mounted on support rings (20), (19) and (18) respectively mounted coaxially supporting disc (16), with the azimuthal rotation, that provides registration complete X-ray spectrum in the angular range (-100 °, + 154 °). In the second embodiment (Figure 3) intended for the same type of process control samples, e.g., monitoring the cryolite ratio in the aluminum raw material base for placing the X-ray radiation source (2), sample detector (14), (15) mounted on the housing ( 1), and X-ray optical circuit is optimized by setting the parameters of removing the sample from the center of the X-ray radiation source and detectors and the X-ray beam on the sample a range of angles of incidence. 2 bp f ly-26 ZP 3-f ly Fig.