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A High-Temperature Furnace and a Heating/Drawing Device Designed for Time-Resolved X-Ray Diffraction Measurements of Polymer Solids Using Imaging Plates

机译：高温炉和加热/抽气装置，用于使用成像板对聚合物固体进行时间分辨的X射线衍射测量

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Murakami Syozo; Tanno Kiyomitsu; Tsuji Masaki; Kohjiya Shinzo;
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年度 1995
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正文语种 en
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专利

1. Development of Heating/Drawing Device for in situ X-Ray Diffraction Measurement of Polymer Films during Uniaxial Drawing [J] . Syozo Murakami 日本化学会誌. 化学と工业化学 . 2000,第2期

机译：单轴拉伸期间聚合物膜原位X射线衍射测量的加热/拉伸装置的研制
2. Development of Heating/Drawing Device for in situ X-Ray Diffraction Measurement of Polymer Films during Uniaxial Drawing [J] . Syozo Murakami 日本化学会誌. 化学と工业化学 . 2000,第2期

机译：单轴拉伸期间聚合物膜原位X射线衍射测量的加热/拉伸装置的研制
3. Generation and relaxation of large stress in the photoinduced solid-state polymerization reaction of diethyl muconate detected by simultaneous time-resolved measurement of X-ray diffraction and raman spectra [J] . K.Tashiro, S.Nakamoto, T.Fujii, Polymer: The International Journal for the Science and Technology of Polymers . 2003,第19期

机译：X射线衍射和拉曼光谱的同时时间分辨测量检测到粘康酸二乙酯的光诱导固态聚合反应中大应力的产生和松弛
4. A New Furnace For High-Temperature Synchrotron X-ray Powder Diffraction Experiments — Electron Density Analysis By Powder X-ray Diffraction At 1300°C [C] . Masahiko Tanaka, Masatomo Yashima, Takeharu Mori International Conference on Synchrotron Radiation Instrumentation . 2004

机译：一种新的高温同步X射线粉末衍射实验 - 通过粉末X射线衍射在1300℃下进行电子密度分析
5. Ultrafast lattice dynamics in solids probed by time-resolved x-ray diffraction. [D] . Lindenberg, Aaron Michael. 2001

机译：通过时间分辨X射线衍射探测的固体中超快晶格动力学。
6. A novel high-temperature furnace for combined in situ synchrotron X-ray diffraction and infrared thermal imaging to investigate the effects of thermal gradients upon the structure of ceramic materials [O] . James B. Robinson, Leon D. Brown, Rhodri Jervis, -1

机译：一种新颖的高温炉用于原位同步加速器X射线衍射和红外热成像相结合研究热梯度对陶瓷材料结构的影响
7. Development of Heating/Drawing Device for in situ X-Ray Diffraction Measurement of Polymer Films during Uniaxial Drawing. [O] . Syozo MURAKAMI 2000

机译：高轴拉伸期间聚合物膜原位X射线衍射测量的加热/拉伸装置的研制。
8. Elliptical Spectrograph/Gated Microchannel Plate Detector for Time-Resolved Spectral Measurements in the X-Ray Region [R] . Hammel, B. A. , Ruggles, L. E. 1988

机译：椭圆光谱仪/门控微通道板检测器，用于X射线区域的时间分辨光谱测量

A High-Temperature Furnace and a Heating/Drawing Device Designed for Time-Resolved X-Ray Diffraction Measurements of Polymer Solids Using Imaging Plates

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