Detection of an attempted break-in on a chip through its support structure

摘要

It is necessary to detect a break-in or attempted, on an electronic chip (3) and / or through a structure (1) a support of the chip to which the chip is connected in a location (30). Facing this location, is added to the structure - support, by integrating or by adding, a means (5) indicative of a break-in, at least one physical parameter that varies depending on whether it is in a first reference state corresponding to a state of the developer is not affected by a break-in or in a second state of a break-in or attempted break-in, corresponding to a state change of sign of a break-in.