IMAGE PROCESSOR FOR VISUAL INSPECTION DEVICE OF SEMICONDUCTOR, VISUAL INSPECTION DEVICE OF SEMICONDUCTOR AND IMAGE PROCESSING METHOD

摘要

PPROBLEM TO BE SOLVED: To solve the problem that it is difficult to achieve a flaw judging and processing function by a plurality of image processing programs because it is impossible to store the image processing programs exceeding a memory size restriction by the memory size restriction of the hardware of processor elements (PE) in an image processor having a plurality of multiprocessor units each of which is composed of a plurality of the processor elements (PE). PSOLUTION: A plurality of image processing programs are held in a whole control computer, the download of the image processing programs is executed with respect to the memory space of the respective processor elements (PE) in a plurality of the multiprocessor units to replace the image processing programs with each other, and an initial value file is read from the whole control computer in the respective processor elements (PE) to perform flaw judging processing using the image processing programs subjected to the download. PCOPYRIGHT: (C)2009,JPO&INPIT