首页> 外国专利> STRUCTURE OF EVALUATING INSULATION RELIABILITY OF INTERLAYER CONNECTION CIRCUIT PART OF PRINTED WIRING BOARD, AND METHOD OF EVALUATING THE INSULATION RELIABILITY

STRUCTURE OF EVALUATING INSULATION RELIABILITY OF INTERLAYER CONNECTION CIRCUIT PART OF PRINTED WIRING BOARD, AND METHOD OF EVALUATING THE INSULATION RELIABILITY

机译:印刷线路板的层间连接电路部分的绝缘可靠性评估结构以及评估绝缘可靠性的方法

摘要

PROBLEM TO BE SOLVED: To provide a structure of evaluating insulation reliability of an interlayer connection circuit part of a printed wiring board capable of a highly accurate and highly reliable insulation evaluation test even when an inter-wall insulation distance is ≤0.1 mm, and to provide an evaluation test method using the same.;SOLUTION: The structure of evaluating insulation reliability of the interlayer connection circuit of the printed wiring board is characterized in that: on an inner layer circuit-containing substrate includes an insulation layer inside and equipped with surface insulation layers on upper layers of both of first and second conductor layers provided respectively on one surface and the other surface of a copper-plated laminate having a plurality of electric wires formed on both conductor layers, a series chain line is formed including a through-via having a conductor on an internal wall to have the respective electric wires of the first and second conductor layers alternately connected; a width of each wire is not larger than a diameter of the through-via; and an end of the conductor layer provided on the internal wall of the through-via is located inward from the surface of the surface insulation layer. The method of evaluating the insulation reliability is also provided using the structure.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种评估印刷线路板的层间连接电路部分的绝缘可靠性的结构,即使在壁间绝缘距离为0.1mm以上的情况下,也能够进行高精度且高度可靠的绝缘评估测试;以及解决方案:评估印刷线路板的层间连接电路的绝缘可靠性的结构的特征在于:在包含内层电路的基板上包括内部绝缘层并配备有在分别设置在两个导体层上形成有多条电线的镀铜层压板的一个表面和另一个表面上的第一和第二导体层的上层上的表面绝缘层上,形成包括贯通孔的串联链线-通过在内壁上具有导体以具有第一和第二导电的相应电线或层交替连接;每条线的宽度不大于通孔的直径;设置在贯通孔的内壁上的导体层的一端位于比表面绝缘层的表面靠内侧的位置。还使用该结构提供了评估绝缘可靠性的方法。版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009218277A

    专利类型

  • 公开/公告日2009-09-24

    原文格式PDF

  • 申请/专利权人 HITACHI CHEM CO LTD;

    申请/专利号JP20080058068

  • 发明设计人 FUKUDA TOMIO;

    申请日2008-03-07

  • 分类号H05K3/46;

  • 国家 JP

  • 入库时间 2022-08-21 19:44:37

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