首页> 外国专利> POINT DEFECT DETECTING DEVICE AND POINT DEFECT DETECTING METHOD

POINT DEFECT DETECTING DEVICE AND POINT DEFECT DETECTING METHOD

机译:点缺陷检测装置和点缺陷检测方法

摘要

PROBLEM TO BE SOLVED: To provide a point defect detecting device and a point defect detecting method capable of detecting point defect at high precision.;SOLUTION: A point defect detecting system 1 comprises: a liquid crystal panel 23 displaying images; a pattern generator 3 controlling for displaying a plurality of test images by changing the voltage values applied to the liquid crystal panel 23; a CCD camera 4 photographing the plurality of the test images; a pixel analyzing means detecting point defect candidate pixels which become point defect candidates for each of the photographed images; an image integration means integrating the brightness values of the point defect candidate pixels with the same pixel position in a plurality of photographed images by recognizing the pixel position and the brightness value of these point defect candidate pixels;and a defect detecting means detecting the pixel whose integrated brightness value of the point defect candidate pixels is larger than a predetermined detection threshold value as the point of defect pixel.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种能够高精度地检测点缺陷的点缺陷检测装置和点缺陷检测方法。解决方案:点缺陷检测系统1包括:显示图像的液晶面板23;和用于显示图像的液晶面板23。图案产生器3,其通过改变施加到液晶面板23的电压值来控制以显示多个测试图像; CCD照相机4拍摄多个测试图像。像素分析装置检测成为每个拍摄图像的点缺陷候选的点缺陷候选像素;图像积分装置,通过识别多个点缺陷候选像素的像素位置和亮度值,对多个摄影图像中具有相同像素位置的点缺陷候选像素的亮度值进行积分;以及缺陷检测装置,其检测像素点缺陷候选像素的积分亮度值大于预定检测阈值作为点缺陷像素。; COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009079983A

    专利类型

  • 公开/公告日2009-04-16

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20070248938

  • 发明设计人 ICHIKAWA HIRONARI;

    申请日2007-09-26

  • 分类号G01M11/00;G02F1/13;

  • 国家 JP

  • 入库时间 2022-08-21 19:43:35

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号