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Detecting defects of vacuum nanoelectron devices and IC based on penetrate insulating layer non-destructive endoscopy method in SEM

机译:基于渗透绝缘层无损内窥镜检查方法检测真空纳米电子装置和IC的缺陷

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摘要

This paper is introduced untouchedly and Nondestructively new testing method and instrument, this new method called “Electron Beam Nondestructively Microscopically Penetrate Insulating Layer endoscopy VNED, IC and Semiconductor Detecting Method and Instrument”.
机译:本文采用无情地和非破坏性的新型测试方法和仪器,这种新方法称为“电子束非破坏性微观渗透绝缘层内窥镜检查VNED,IC和半导体检测方法和仪器”。

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