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REFLOW PROCESS EVALUATION DEVICE, REFLOW PROCESS EVALUATION PROGRAM, AND REFLOW PROCESS EVALUATION METHOD

机译:回流过程评价装置,回流过程评价程序和回流过程评价方法

摘要

PROBLEM TO BE SOLVED: To provide the reflow process evaluation device capable of easily calculating a breaking occurring ratio based on average main stress.;SOLUTION: The reflow process evaluation device includes a structure analyzing and calculation part 2 for calculating the average main stress acting on a joint part receiving the main stress produced by joining a chip and a substrate by solder using a reflow system, a solder layout selection part 3, a chip stress extraction part 4, an extracted stress calculation part 5, and a peel occurring ratio calculation part 6 for calculating the breaking occurring ratio from a relational expression of the breaking occurring ratio of the joint part and the average main stress acting on the joint part and the calculated average main stress.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种能够基于平均主应力容易地计算断裂发生率的回流过程评估装置;解决方案:回流过程评估装置包括结构分析和计算部分2,用于计算作用在平均应力上的平均主应力。接合部接收通过使用回流系统通过焊料将芯片与基板接合而产生的主应力的接合部,焊料布局选择部3,芯片应力提取部4,提取应力计算部5和剥离发生率计算部6,用于根据接合部的断裂发生率与作用在接合部上的平均主应力与算出的平均主应力的关系式来计算断裂发生率。COPYRIGHT:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009150740A

    专利类型

  • 公开/公告日2009-07-09

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20070328161

  • 发明设计人 KOBAYASHI YOKO;

    申请日2007-12-20

  • 分类号G01N3/00;H01L21/60;H05K3/34;

  • 国家 JP

  • 入库时间 2022-08-21 19:42:28

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