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SEMICONDUCTOR DEVICE HAVING BIT LINE LANDING PAD AND BORDERLESS CONTACT ON BIT LINE STUD WITH LOCALIZED ETCH STOP MATERIAL LAYER AND FABRICATING METHOD THEREOF
SEMICONDUCTOR DEVICE HAVING BIT LINE LANDING PAD AND BORDERLESS CONTACT ON BIT LINE STUD WITH LOCALIZED ETCH STOP MATERIAL LAYER AND FABRICATING METHOD THEREOF
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机译:具有局部刻蚀停止层的位线着陆垫和无边界接触位线螺柱的半导体器件及其制造方法
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摘要
PROBLEM TO BE SOLVED: To provide a semiconductor device which has a bit line landing pad and a borderless contact with a localized etch-stop material layer and has a relatively dense structure, and a fabricating method thereof.;SOLUTION: Inter-layer constact studs 220a and 220b are formed, and a conductive line 222 is provided over the inter-layer contact stud 220b. A first etch-stop material layer 224a and a second etch-stop material layer 224b are selectively provided over them. The conductive line 222 is provided with a side wall insulating film 226. Material of the first etch-stop material layer and that of the side wall insulating film are different by etch selectivity. These etch-stop material layers allow outgassing of impurities during subsequent processes and serve as an alignment target when forming an upper contact hole 229a.;COPYRIGHT: (C)2009,JPO&INPIT
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