首页> 外国专利> SALT FOR ACID GENERATOR OF CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION, METHOD FOR PRODUCING THE SAME AND CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION

SALT FOR ACID GENERATOR OF CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION, METHOD FOR PRODUCING THE SAME AND CHEMICALLY AMPLIFIED PHOTORESIST COMPOSITION

机译:化学增强的光致抗蚀剂组合物的酸发生剂的盐,其制备方法和化学增强的光致抗蚀剂组合物的方法

摘要

PROBLEM TO BE SOLVED: To provide a salt which become an acid generator providing a chemically amplified resist composition capable of forming a pattern having good pattern form and exhibiting high resolving power.;SOLUTION: The present invention provides a salt represented by formula (I) (wherein Q1 and Q2 each independently represent a fluorine atom or a 1-6C perfluoroalkyl group; T represents a methylene group or a carbonyl group; U1, U2 and U3 are mutually independently a hydrogen atom, a 1-4C alkyl group, a 1-4C alkoxy group, a hydroxy group, a hydroxymethyl group or a cyano group or U1 and U2 may together exhibit an oxo group, with the proviso that U1, U2 and U3 are not simultaneously hydrogen atoms; A+ represents an organic pair ion).;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种盐,其成为产酸剂,提供化学放大的抗蚀剂组合物,该组合物能够形成具有良好图案形状并显示出高分辨力的图案。溶液:本发明提供了由式(I)表示的盐(其中Q 1 和Q 2 各自独立地表示氟原子或1-6C全氟烷基; T表示亚甲基或羰基; U 1 ,U 2 和U 3 相互独立地是氢原子,1-4C烷基,1-4C烷氧基,羟基,羟甲基或氰基或U 1 和U 2 可以一起显示一个氧代基,条件是U 1 ,U 2 和U 3 并非同时为氢原子; A + 表示有机对离子。)版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2009046479A

    专利类型

  • 公开/公告日2009-03-05

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL CO LTD;

    申请/专利号JP20080190652

  • 发明设计人 TAKEMOTO KAZUKI;

    申请日2008-07-24

  • 分类号C07C309/12;C07C381/12;G03F7/004;G03F7/039;H01L21/027;C08F220/10;

  • 国家 JP

  • 入库时间 2022-08-21 19:40:15

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