首页> 外国专利> Formation method of the semiconductor device which has the asymmetry induced electricity territory and structure of its semiconductor device

Formation method of the semiconductor device which has the asymmetry induced electricity territory and structure of its semiconductor device

机译:具有不对称感应电区域和结构的半导体器件的形成方法

摘要

A method for forming a semiconductor device including forming a semiconductor substrate; forming a gate electrode over the semiconductor substrate having a first side and a second side, and forming a gate dielectric under the gate electrode. The gate dielectric has a first area under the gate electrode and adjacent the first side of the gate electrode, a second area under the gate electrode and adjacent the second side of the gate electrode, and a third area under the gate electrode that is between the first area and the second area, wherein the first area is thinner than the second area, and the third area is thinner than the first area and is thinner than the second area.
机译:一种形成半导体器件的方法,包括形成半导体衬底;在具有第一侧和第二侧的半导体衬底上方形成栅电极,并在栅电极下方形成栅电介质。栅极电介质具有在栅电极下方且与栅电极的第一侧相邻的第一区域,在栅电极下方且与栅电极的第二侧相邻的第二区域以及在栅电极之间的在栅电极之间的第三区域。第一区域和第二区域,其中第一区域比第二区域薄,并且第三区域比第一区域薄并且比第二区域薄。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号