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In the scan pass circuit which is loaded onto the logic circuit of test mannered null scan design mode
In the scan pass circuit which is loaded onto the logic circuit of test mannered null scan design mode
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机译:在加载到测试方式为零扫描设计模式的逻辑电路的扫描通过电路中
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摘要
PROBLEM TO BE SOLVED: To determine the presence of a failure, and to specify a position thereof when the failure is found, in a short time, in a scan design test system of logic circuit 21 wherein a scan path circuit 23 is constituted by connecting serially flip-flops F1-F4 serving as an input and an output in a combinational logic circuit 22, and wherein test results therein are output serially in the flip-flops F1-F4 constituting the scan path circuit 23 to conduct a test easily.;SOLUTION: Selectors S2-S4 are provided to connect directly the inputs of the flip-flops F1-F4 constituting the scan path circuit 23 to an scan input D0, all the flip-flops F1-F4 are set once to the same value (1 or 0 in all), and are shift-output thereafter to specify a failure portion. A test period is brought into a clock number required for a shift operation for the number of steps + one step, even in the longest period.;COPYRIGHT: (C)2005,JPO&NCIPI
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