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SLACK-BASED TRANSITION-FAULT TESTING

机译:基于SLACK的过渡故障测试

摘要

A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.
机译:一种生成测试模式以检测集成电路(IC)中的过渡故障的系统。在运行期间,系统会为IC中的每个网络接收空闲时间。请注意,网络的松弛时间是给定网络在违反时序约束之前可以忍受的最小延迟量。对于IC中每个可能的过渡故障,系统使用IC中网络的松弛时间来生成测试图,该测试图通过产生沿最长路径传播到过渡故障的过渡来暴露过渡故障。

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