首页> 外国专利> MODULATING THE STRESS OF POLY-CRYSTALINE SILICON FILMS AND SURROUNDING LAYERS THROUGH THE USE OF DOPANTS AND MULTI-LAYER SILICON FILMS WITH CONTROLLED CRYSTAL STRUCTURE

MODULATING THE STRESS OF POLY-CRYSTALINE SILICON FILMS AND SURROUNDING LAYERS THROUGH THE USE OF DOPANTS AND MULTI-LAYER SILICON FILMS WITH CONTROLLED CRYSTAL STRUCTURE

机译:通过使用可控的晶体结构的多点和多层硅膜来调节多晶硅膜的应力和环绕层

摘要

In certain embodiments a method of forming a multi-layer silicon film is provided. A substrate is placed in a process chamber. An amorphous silicon film is formed on the substrate by flowing into the process chamber a first process gas comprising a silicon source gas. A polysilicon film is formed on the amorphous silicon film by flowing into the deposition chamber a first process gas mix comprising a silicon source gas and a first dilution gas mix comprising H2 and an inert gas at a first temperature. In certain embodiments, the polysilicon film has a crystal orientation which is dominated by the 220 direction. In certain embodiments, the polysilicon film has a crystal orientation dominated by the 111 orientation. Structures comprising a lower amorphous silicon film and an upper polysilicon film having a random grain structure or a columnar grain structure are provided as well.
机译:在某些实施例中,提供了一种形成多层硅膜的方法。将基板放置在处理室中。通过使包括硅源气体的第一处理气体流入处理室,在基板上形成非晶硅膜。通过在第一温度下使包含硅源气体的第一处理气体混合物和包含H 2 的第一稀释气体混合物和惰性气体流入沉积室中,在非晶硅膜上形成多晶硅膜。 。在某些实施例中,多晶硅膜具有以<220>方向为主的晶体取向。在某些实施例中,多晶硅膜具有以<111>取向为主的晶体取向。还提供了包括下部非晶硅膜和上部多晶硅膜的结构,所述下部非晶硅膜和上部多晶硅膜具有无规晶粒结构或柱状晶粒结构。

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