首页> 外国专利> Self-aligned LDMOS fabrication method integrated deep-sub-micron VLSI process, using a self-aligned lithography etches and implant process

Self-aligned LDMOS fabrication method integrated deep-sub-micron VLSI process, using a self-aligned lithography etches and implant process

机译:采用自对准光刻蚀刻和注入工艺的自对准LDMOS制造方法集成了深亚微米VLSI工艺

摘要

An integrated circuit includes both LDMOS devices and one or more low-power CMOS devices that are concurrently formed on a substrate using a deep sub-micron VLSI fabrication process. The LDMOS polycrystalline silicon (polysilicon) gate structure is patterned using a two-mask etching process. The first etch mask is used to define a first edge of the gate structure located away from the deep body/drain implant. The second etch mask is then used to define a second edge of the gate structure, and the second etch mask is then retained on the gate structure during subsequent formation of the deep body/drain implant. After the deep implant, shallow implants and metallization are formed to complete the LDMOS device.
机译:集成电路包括LDMOS器件和一个或多个低功率CMOS器件,它们使用深亚微米VLSI制造工艺同时形成在基板上。 LDMOS多晶硅(多晶硅)栅极结构使用双掩模蚀刻工艺进行构图。第一蚀刻掩模用于限定栅极结构的第一边缘,其远离深体/漏极注入。然后使用第二蚀刻掩模来限定栅极结构的第二边缘,然后在后续的深体/漏极注入的后续形成期间将第二蚀刻掩模保持在栅极结构上。在深注入之后,形成浅注入和金属化以完成LDMOS器件。

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