首页> 外国专利> Programming differently sized margins and sensing with compensations at select states for improved read operations in non-volatile memory

Programming differently sized margins and sensing with compensations at select states for improved read operations in non-volatile memory

机译:对不同大小的裕度进行编程,并在选择状态下进行补偿检测,以改善非易失性存储器中的读取操作

摘要

Non-volatile memory read operations compensate for floating gate coupling when the apparent threshold voltage of a memory cell may have shifted. A memory cell of interest can be read using a reference value based on a level of charge read from a neighboring memory cell. Misreading the neighboring cell may have greater effects in particular programming methodologies, and more specifically, when reading the neighboring cell for particular states or charge levels in those methodologies. In one embodiment, memory cells are programmed to create a wider margin between particular states where misreading a neighboring cell is more detrimental. Further, memory cells are read in one embodiment by compensating for floating gate coupling based on the state of a neighboring cell when reading at certain reference levels but not when reading at other reference levels, such as those where a wider margin has been created.
机译:当存储器单元的视在阈值电压可能已经偏移时,非易失性存储器读取操作将补偿浮栅耦合。可以使用参考值基于从相邻存储单元读取的电荷水平来读取目标存储单元。在特定的编程方法中,错误读取相邻单元可能会产生更大的影响,更具体地说,当在这些方法中读取相邻单元的特定状态或电荷水平时,会产生更大的影响。在一实施例中,存储器单元经编程以在特定状态之间产生较宽的余量,其中误读邻近单元更有害。此外,在一个实施例中,当以某些参考电平读取时基于相邻单元的状态补偿浮栅耦合来读取存储单元,而当以其他参考电平读取时(诸如已创建更宽裕度的那些),则不基于相邻单元的状态来对存储单元进行读取。

著录项

  • 公开/公告号US7606084B2

    专利类型

  • 公开/公告日2009-10-20

    原文格式PDF

  • 申请/专利权人 TERUHIKO KAMEI;

    申请/专利号US20060425111

  • 发明设计人 TERUHIKO KAMEI;

    申请日2006-06-19

  • 分类号G11C5/14;

  • 国家 US

  • 入库时间 2022-08-21 19:32:10

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