首页> 外国专利> PROGRAMMING DEFFERENTLY SIZED MARGINS AND SENSING WITH COMPENSATIONS AT SELECT STATES FOR IMPROVED READ OPERATIONS IN NON-VOLATILE MEMORY

PROGRAMMING DEFFERENTLY SIZED MARGINS AND SENSING WITH COMPENSATIONS AT SELECT STATES FOR IMPROVED READ OPERATIONS IN NON-VOLATILE MEMORY

机译:对不同大小的边距进行编程,并在选择状态下进行补偿,以提高非易失性内存中的读取操作

摘要

is the apparent threshold voltage shift of the memory cell when a non-volatile memory read operations compensate for floating gate coupling . The memory cell can be read using a reference value based on a level of charge read out from the memory of the neighboring cells. The incorrectly reads the neighboring cells may have a significant impact on the particular programming method, it is even more so when reading the neighboring cell for particular states or charge levels in particular in this way. In one embodiment, the memory cells are programmed to create a wider margin between the more specific it is more detrimental to incorrectly read the state of the neighboring cells. In addition, the memory cells are in one embodiment, not when reading at other reference levels, such as those where a wider margin has been created, when read at some reference level, a floating gate coupling based on the state of neighboring cells By compensation is read.
机译:是非易失性存储器读取操作补偿浮栅耦合时存储器单元的表观阈值电压偏移。可以使用基于从相邻单元的存储器中读出的电荷水平的参考值来读取存储单元。错误读取相邻单元可能会对特定的编程方法产生重大影响,尤其是以这种方式读取相邻单元的特定状态或电荷水平时尤其如此。在一个实施例中,存储器单元被编程为在更具体地在错误地读取相邻单元的状态更有害的范围之间产生更大的余量。另外,在一个实施例中,存储单元不是在以其他参考电平(例如已经创建了更宽裕度的那些参考电平)读取时,而是在以某个参考电平读取时基于相邻单元的状态的浮栅耦合。被读取。

著录项

  • 公开/公告号KR101020812B1

    专利类型

  • 公开/公告日2011-03-09

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20087023382

  • 发明设计人 가메이 데루히코;

    申请日2007-05-25

  • 分类号G11C16/26;G11C16/34;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:33

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