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CMP conditioner, method for arranging hard abrasive grains for use in CMP conditioner, and process for producing CMP conditioner

机译:CMP修整器,用于CMP修整器的硬质磨粒的布置方法以及CMP修整器的制造方法

摘要

Disclosed are CMP conditioners which can suppress microscratching of the surface of a semiconductor substrate and can realize stable CMP conditioner properties. The CMP conditioner according to the first aspect of the present invention comprises a support member and a plurality of hard abrasive grains provided on a surface of the support member, wherein the plurality of hard abrasive grains are regularly arranged on the surface of the support member. The CMP conditioner according to the second aspect of the present invention comprises a support member and a plurality of hard abrasive grains provided on the surface of the support member, wherein the plurality of hard abrasive grains are arranged on the surface of the support member regularly and so as for the density of the hard abrasive grains to decrease from the inner side of the support member toward the outer side of the support member.
机译:公开了一种CMP调节剂,其可以抑制半导体衬底表面的微划痕并且可以实现稳定的CMP调节剂性能。根据本发明的第一方面的CMP修整器包括支撑构件和设置在该支撑构件的表面上的多个硬磨粒,其中该多个硬磨粒规则地布置在该支撑构件的表面上。根据本发明的第二方面的CMP修整器包括支撑构件和设置在该支撑构件的表面上的多个硬质磨料颗粒,其中该多个硬质磨料颗粒规则地并排地布置在该支撑构件的表面上。因此,硬质磨粒的密度从支撑构件的内侧向支撑构件的外侧降低。

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