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METHOD AND SYSTEM FOR TRACKING SCATTERING PARAMETER TEST SYSTEM CALIBRATION
METHOD AND SYSTEM FOR TRACKING SCATTERING PARAMETER TEST SYSTEM CALIBRATION
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机译:跟踪散射参数测试系统校准的方法和系统
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摘要
Embodiments describe methods of correcting S-parametermeasurements for a DUT. The method includes coupling at least one trackingmodule associated with a set of electrical standards to a S-parametermeasurement device to form a test system. An initial calibration for the testsystem is then determined. This may include measuring the S-parameters of theelectrical standards, generating a calibration along a calibration plane,generatinga calibration along a correction plane and determining at least one erroradapterfrom the calibrations. The DUT is coupled to the test system and theS-parameters of the DUT are measured. Changes in the initial calibration aretracked using the tracking modules. Tracking may include measuring theS-parameters of the electrical standards, generating a correction planecalibrationand generating a corrected calibration plane calibration from the correctionplanecalibration and the error adapter(s). The measured S-parameters are correctedusing the tracked changes.
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