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Method and system for tracking scattering parameter test system calibration

机译:跟踪散射参数测试系统校准的方法和系统

摘要

Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration for the test system is then determined. This may include measuring the S-parameters of the electrical standards, generating a calibration along a calibration plane, generating a calibration along a correction plane and determining at least one error adapter from the calibrations. The DUT is coupled to the test system and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules. Tracking may include measuring the S-parameters of the electrical standards, generating a correction plane calibration and generating a corrected calibration plane calibration from the correction plane calibration and the error adapter(s). The measured S-parameters are corrected using the tracked changes.
机译:实施例描述了校正DUT的S参数测量的方法。该方法包括将与一组电标准相关联的至少一个跟踪模块耦合到S参数测量装置以形成测试系统。然后确定测试系统的初始校准。这可以包括测量电气标准的S参数,沿着校准平面生成校准,沿着校正平面生成校准以及从校准中确定至少一个误差适配器。 DUT耦合到测试系统,并测量DUT的S参数。使用跟踪模块可以跟踪初始校准的变化。跟踪可以包括测量电气标准的S参数,生成校正平面校准以及根据校正平面校准和误差适配器生成校正的校准平面校准。使用跟踪的变化对测量的S参数进行校正。

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