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METHOD TO IMPROVE PERFORMANCE OF SECONDARY ACTIVE COMPONENTS IN AN ESIGE CMOS TECHNOLOGY

机译:ESIGE CMOS技术中提高二级活性成分性能的方法

摘要

According to various embodiments, there are eSiGe CMOS devices and methods of making them. The method of making a substrate for a CMOS device can include providing a DSB silicon substrate including a first bonded to a second layer, wherein each layer has a (100) oriented surface and a first direction and a second direction and the first direction of the first layer is approximately aligned with the second direction of the second layer. The method can also include performing amorphization on a selected region of the first layer to form a localized amorphous silicon region and recrystallizing the localized amorphous silicon region across the interface using the second layer as a template, such that the first direction of the first layer in the selected region is approximately aligned with the first direction of the second layer.
机译:根据各种实施例,存在eSiGe CMOS器件及其制造方法。制备用于CMOS器件的衬底的方法可以包括提供DSB硅衬底,该DSB硅衬底包括结合到第二层的第一衬底,其中每一层具有(100)取向的表面以及衬底的第一方向和第二方向以及第一方向。第一层与第二层的第二方向大致对准。该方法还可包括对第一层的选定区域进行非晶化以形成局部非晶硅区域,并使用第二层作为模板使界面上的局部非晶硅区域再结晶,使得第一层的第一方向为所选区域与第二层的第一方向大致对准。

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