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MULTI-LAYER FILM SPECTROSCOPIC ELEMENT FOR BORON FLUORESCENCE X-RAY ANALYSIS
MULTI-LAYER FILM SPECTROSCOPIC ELEMENT FOR BORON FLUORESCENCE X-RAY ANALYSIS
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机译:多层膜光谱元素用于硼荧光X射线分析
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摘要
There is provided a multilayered spectroscopic device effective to achieve in a short length of time the highly accurate fluorescent X-ray analysis of boron wherein the influence that may be brought about by the interfering X-rays and the background is sufficiently reduced and the strength of reflection of B-Kα line is sufficient. In this multilayered spectroscopic device 3, lanthanum (La), an alloy containing lanthanum as a principal component or lanthanum oxide (La2O3) is used for the reflecting layers 31 and boron is used for the spacer layers 32 and the periodic length d is chosen to be within the range of 7 to 14 nm and the film thickness ratio of the reflecting layers 31 to the spacer layers 32 is chosen to be within the range of 2/3 to 3/2. It has a total laminated film thickness t of a value sufficient to allow the strength of reflection of B-Kα line to be equal to or higher than 98% of a saturation value.
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