TESTING APPARATUS, TESTING METHOD, JITTER FILTER CIRCUIT, AND JITTER FILTERING METHOD

摘要

Provided is a testing apparatus for evaluating devices to be tested. The testing apparatus is provided with an extracting section for extracting a jitter component from an output signal outputted from the device to be tested; a filter for passing through a prescribed frequency component in the jitter component; a phase control section for controlling the phase of the output signal, based on the jitter component outputted from the filter; and an evaluating section for evaluating the device to be tested, based on a signal outputted from the phase control section.