There is provided a testing apparatus for evaluating a device-under-test, having an extracting section for extracting jitter components out of an output signal outputted out of the device-under-test, a filter for passing predetermined frequency components in the jitter components, a phase control section for controlling phase of the output signal based on the jitter components outputted out of the filter and an evaluating section for evaluating the device-under-test based on a signal outputted out of the phase control section.
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