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EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD TO PREVENT CONTAMINATION OF OPTICAL ELEMENT

机译:防止光学元件污染的曝光装置和装置制造方法

摘要

PURPOSE: An exposure apparatus is provided to maintain the transmittance ratio of the exposure light and prevent the contamination of the optical element.;CONSTITUTION: The exposure apparatus(700) exposes the circuit pattern formed in the vacuum on the top of the substrate. The exposure apparatus includes the vacuum chamber(1~5), and wire electrode array(30). The vacuum chamber has a plurality of the regions. The wire electrode array has parallel wire electrodes. The wire electrode array has the first wire electrode group, and the second wire electrode group. The first wire electrode group is arranged to the opening(25~28) of the exposure light at a boundary between adjacent vacuum chambers. In the first wire electrode group, the AC voltage of the first phase is applied. In the second wire electrode group, the different from the first phase AC voltage of the second phases is applied.;COPYRIGHT KIPO 2010
机译:目的:提供曝光设备以保持曝光光的透射率并防止光学元件的污染。;组成:曝光设备(700)将在真空中形成的电路图案曝光在基板的顶部。曝光装置包括真空室(1〜5)和线电极阵列(30)。真空室具有多个区域。线电极阵列具有平行的线电极。线电极阵列具有第一线电极组和第二线电极组。第一线电极组在相邻的真空室之间的边界处布置到曝光的开口(25〜28)。在第一线电极组中,施加第一相的AC电压。在第二电极丝组中,施加不同于第二相的第一相交流电压。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20090103847A

    专利类型

  • 公开/公告日2009-10-01

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号KR20090026673

  • 发明设计人 HAMAYA ZENICHI;

    申请日2009-03-27

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 19:12:32

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