首页> 外国专利> A method for determining a with shim means to be passive correction of an inhomogeneity of an arc as c - a magnetic resonance tomograph and coil apparatus, adapted for use in the method

A method for determining a with shim means to be passive correction of an inhomogeneity of an arc as c - a magnetic resonance tomograph and coil apparatus, adapted for use in the method

机译:一种用于确定带有匀场的a的方法,该方法用于对c的电弧的不均匀性进行被动校正-磁共振断层扫描仪和线圈设备,适用于该方法

摘要

A method for determining a with shim means to be passive correction of an inhomogeneity of a magnetic resonance tomograph, which is designed as a c - sheet, comprising the steps of:– Arranging at least one individually controllable coils (3) comprising a coil apparatus (1, 5) in the region of a magnetic pole of a basic field magnet (6) of the magnetic resonance tomograph,– Introduction of a means (7) for measuring the magnetic field of the main field magnet (6) in a central magnetic field range,– Determination of the field strength distribution and a passive correction to be carried out as a function of the measuring result,– Control of the coil apparatus (1, 5) in dependence on for the individual coils (3) of the passive correction certain control currents and– renewed determination of the field strength distribution and a, for further reduction of the inhomogeneity of the passive correction in the control currents applied to be undertaken.
机译:一种用于确定是否为被动断层扫描仪的不均匀性的方法,该方法被设计为ac-sheet,包括以下步骤:-布置至少一个可单独控制的线圈(3),包括线圈设备( 1、5)在磁共振断层扫描仪的基本场磁体(6)的磁极区域内,–引入了一种用于测量中心磁场中主场磁体(6)磁场的装置(7)磁场范围,-根据测量结果确定磁场强度分布并进行被动校正,-根据被动线圈的各个线圈(3)对线圈设备(1、5)的控制校正某些控制电流,并重新确定场强分布,并进一步减小所采用的控制电流中无源校正的不均匀性。

著录项

  • 公开/公告号DE102005044634B4

    专利类型

  • 公开/公告日2009-10-29

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20051044634

  • 发明设计人

    申请日2005-09-19

  • 分类号G01R33/3875;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:54

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