首页> 外国专利> METHOD AND APPARATUS FOR NONDESTRUCTIVE MEASUREMENT OF COMPONENT OF VEGETABLE ETC. USING NEAR-INFRARED SPECTROSCOPY

METHOD AND APPARATUS FOR NONDESTRUCTIVE MEASUREMENT OF COMPONENT OF VEGETABLE ETC. USING NEAR-INFRARED SPECTROSCOPY

机译:蔬菜ETC成分的非破坏性测量方法和装置。使用近红外光谱

摘要

PROBLEM TO BE SOLVED: To provide a method and apparatus that accurately and promptly perform nondestructive measurement of a concentration of a target component, by obtaining a calibration curve with high estimation accuracy in near-infrared spectroscopy and by reducing unnecessary information that causes estimation accuracy of the calibration curve to lower.;SOLUTION: The nondestructive measurement method irradiates a food item to be measured, such as a vegetable, fruit, meat, with a light of wavelength in the range of 400 to 2,500 nm or in a part of that range, obtains an absorbance spectrum by detecting the transmitted light and/or the reflected light, and measures the concentration of a target component of a measuring object by using a calibration curve from the absorbance of all measuring wavelengths or a specific wavelength. In the nondestructive measurement method, the irradiation range of the light of a wavelength to a measuring object is limited to a predetermined region. For example, when the concentration of nitrate ions is measured in vegetable or performing the like, the smaller the measuring object becomes in an order as a root, leaf and lamina, the measurement accuracy is further improved. Moreover, the light of the wavelength to be applied to the measuring object with a requisite minimum can be selected. As a result, a calibration curve with high estimation accuracy is obtained, as well as, the measurement time is shortened.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种方法和设备,该方法和设备通过获得在近红外光谱法中具有高估计精度的校准曲线并通过减少引起估计精度的不必要信息来准确而迅速地执行目标组分浓度的无损测量。解决方案:无损测量方法用波长在400至2500 nm或该范围的一部分范围内的光照射被测食品,例如蔬菜,水果,肉通过检测透射光和/或反射光来获得吸收光谱,并使用校准曲线从所有测量波长或特定波长的吸光度来测量被测物体的目标成分的浓度。在无损测量方法中,将波长的光对测量对象的照射范围限制在预定区域。例如,当在蔬菜等中测量硝酸根离子的浓度时,被测物以根,叶和叶片的顺序变小,则测量精度进一步提高。此外,可以选择要施加到测量对象的具有所需最小值的波长的光。结果,获得了具有较高估计精度的校准曲线,并且缩短了测量时间。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010210355A

    专利类型

  • 公开/公告日2010-09-24

    原文格式PDF

  • 申请/专利权人 KOBE UNIV;

    申请/专利号JP20090055779

  • 申请日2009-03-09

  • 分类号G01N21/35;

  • 国家 JP

  • 入库时间 2022-08-21 19:05:02

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