首页> 外国专利> METHOD OF MANUFACTURING NITROGEN DOPED SILICON WAFER AND NITROGEN DOPED SILICON WAFER OBTAINED BY THE SAME

METHOD OF MANUFACTURING NITROGEN DOPED SILICON WAFER AND NITROGEN DOPED SILICON WAFER OBTAINED BY THE SAME

机译:相同制造的氮掺杂硅晶片的制造方法和氮掺杂硅晶片的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing a nitrogen doped silicon wafer and a nitrogen doped silicon wafer obtained by the same, both of which facilitate manufacturing the nitrogen doped silicon wafer injected with high concentration nitrogen necessary for forming high density BMD.;SOLUTION: The method of manufacturing the nitrogen doped silicon wafer includes: a step in which any one of a surface and the backside or both thereof of a silicon wafer to which nitrogen is not doped are made to come in contact with HF solution, thereby silicon in a surface layer portion of a contact face is made to terminate by hydrogen; and a step in which the wafer after hydrogen termination step is held in a nitrogen contained atmosphere at a temperature of 1,100 to 1,300°C for 1 to 100 sec, and nitrogen is injected from a surface layer of a hydrogen termination step face to a depth of 20 μm and with a concentration of 5×1014 to 1×1016atoms/cm3.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种制造氮掺杂的硅晶片的方法以及通过该方法获得的氮掺杂的硅晶片,这两者都有助于制造注入有形成高密度BMD所需的高浓度氮的氮掺杂的硅晶片。解决方案:氮掺杂硅晶片的制造方法包括:使未掺杂氮的硅晶片的表面和背面中的任何一个与二者接触的步骤,从而使硅在接触面的表层部分中,以氢终止。将氢终止步骤后的晶片在温度为1100至1300℃的含氮气氛中保持1至100秒,并从氢终止步骤的表面层向硅注入氮的步骤。深度为20μm,浓度为5×10 14 到1×10 16 atoms / cm 3 .; COPYRIGHT:( C)2010,日本特许厅&INPIT

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