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DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MICROSTRUCTURE OF NANO-MATERIALS UNDER STRESS STATE
DEVICE AND METHOD FOR MEASURING ELECTROMECHANICAL PROPERTIES AND MICROSTRUCTURE OF NANO-MATERIALS UNDER STRESS STATE
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机译:应力状态下纳米材料的机电性能和微观结构的测量装置及方法
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摘要
A device for measuring electromechanical properties and microstructure of nano-materials under stress state comprises two bimetallic strips placed on an insulated metal ring plated with insulating paint, wherein the two bimetallic strips are placed in parallel or V-shaped to insulated metal ring on the same plane, one end of each bimetallic strip is fixed on the insulated metal ring, the other end of the bimetallic strip hangs inside of the insulated ring, the distance of two bimetallic strips were controlled within 0.002-1 mm. Also provided is a method for measuring electromechanical properties and microstructure of nano-materials under stress state.
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