首页> 外国专利> Linear Gate Level Cross-Coupled Transistor Device with Connection Between Cross-Coupled Transistor Gate Electrodes Made Utilizing Interconnect Level Other than Gate Electrode Level

Linear Gate Level Cross-Coupled Transistor Device with Connection Between Cross-Coupled Transistor Gate Electrodes Made Utilizing Interconnect Level Other than Gate Electrode Level

机译:线性栅级交叉耦合晶体管器件,利用互连栅级(而非栅电极级)制成交叉耦合晶体管栅电极之间的连接

摘要

A semiconductor device includes first and second p-type diffusion regions, and first and second n-type diffusion regions that are each electrically connected to a common node. Each of a number of conductive features within a gate electrode level region is fabricated from a respective originating rectangular-shaped layout feature having a centerline aligned parallel to a first direction. The conductive features respectively form gate electrodes of first and second PMOS transistor devices, and first and second NMOS transistor devices. The gate electrodes of the first PMOS and second NMOS transistor devices are electrically connected. The gate electrodes of the second PMOS and first NMOS transistor devices are electrically connected. The electrical connection between the gate electrodes of the first PMOS and second NMOS transistor devices is formed in part by one or more electrical conductors present within at least one interconnect level above the gate electrode level region.
机译:半导体器件包括第一和第二p型扩散区域以及分别电连接到公共节点的第一和第二n型扩散区域。栅电极级区域内的多个导电特征中的每一个均由具有平行于第一方向对准的中心线的相应的始发矩形布局特征制成。导电特征分别形成第一PMOS晶体管器件和第二PMOS晶体管器件以及第二NMOS晶体管器件的栅电极。第一PMOS晶体管器件和第二NMOS晶体管器件的栅极电连接。第二PMOS晶体管和第一NMOS晶体管器件的栅电极电连接。第一PMOS和第二NMOS晶体管器件的栅电极之间的电连接部分地由存在于栅电极级区域上方的至少一个互连层内的一个或多个电导体形成。

著录项

  • 公开/公告号US2010187620A1

    专利类型

  • 公开/公告日2010-07-29

    原文格式PDF

  • 申请/专利权人 SCOTT T. BECKER;

    申请/专利号US20100753789

  • 发明设计人 SCOTT T. BECKER;

    申请日2010-04-02

  • 分类号H01L29/78;

  • 国家 US

  • 入库时间 2022-08-21 18:53:45

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