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Magneto-resistance effect element and thin-film magnetic head having non-magnetic spacer layer composed of one semiconductor layer and two metal layers

机译:具有由一个半导体层和两个金属层组成的非磁性间隔层的磁阻效应元件和薄膜磁头

摘要

A magneto-resistance effect element used for a thin film magnetic head is configured by a buffer layer, an anti-ferromagnetic layer, a pinned layer, a spacer layer, a free layer, and a cap layer, which are laminated in this order, and a sense current flows through the element in a direction orthogonal to the layer surface, via a lower shield layer and a upper shield layer. The pinned layer comprises an outer layer in which a magnetization direction is fixed, a non-magnetic intermediate layer, and an inner layer which is a ferromagnetic layer. The spacer layer comprises a first and second non-magnetic metal layer, and a semiconductor layer. The first and second non-magnetic metal layer and comprise CuPt films having a thickness of more than 0 nm but no more than 2.0 nm, and the Pt content ranges from a minimum of 5 to a maximum of 25 at %.
机译:用于薄膜磁头的磁阻效应元件由依次层叠的缓冲层,反铁磁层,固定层,间隔层,自由层和覆盖层构成,感测电流通过下屏蔽层和上屏蔽层在垂直于层表面的方向上流过元件。固定层包括固定有磁化方向的外层,非磁性中间层和作为铁磁层的内层。隔离层包括第一和第二非磁性金属层以及半导体层。第一和第二非磁性金属层包括厚度大于0nm但不大于2.0nm的CuPt膜,并且Pt含量在最小5at%至最大25at%的范围内。

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