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Thin film capacitance element composition, high permittivity insulation film, thin film capacitance element, thin film multilayer capacitor and production method of thin film capacitance element

机译:薄膜电容元件组合物,高介电常数绝缘膜,薄膜电容元件,薄膜多层电容器及其制造方法

摘要

A thin film capacitance element composition, wherein a bismuth layer compound having a c-axis oriented vertically with respect to a substrate surface is expressed by a composition formula of (Bi2O2)2+(Am−1BmO3m+1)2− or Bi2Am−1BmO3m+3, wherein “m” is an even number, “A” is at least one element selected from Na, K, Pb, Ba, Sr, Ca and Bi, and “B” is at least one element selected from Fe, Co, Cr, Ga, Ti, Nb, Ta, Sb, V, Mo and W; and Bi in the bismuth layer compound is excessively included with respect to the composition formula of (Bi2O2)2+(Am−1BmO3m+1)2− or Bi2Am−1BmO3m+3, and the excessive content of Bi is in a range of 0Bi0.5×m mol in of Bi.
机译:以(Bi 2 O 2 2 + (A m-1 B m O 3m + 1 2- < / Sup>或Bi 2 A m-1 B m O 3m + 3 ,其中“ m”为偶数,“ A”是选自Na,K,Pb,Ba,Sr,Ca和Bi中的至少一种元素,“ B”是选自Fe,Co,Cr,Ga,Ti,Nb中的至少一种元素,Ta,Sb,V,Mo和W;铋层化合物中的Bi相对于(Bi 2 O 2 2 + (A m-1 B m O 3m + 1 2-−Sup>或Bi 2 A < Sub> m-1 B m O 3m + 3 ,其中Bi的过量含量在0

著录项

  • 公开/公告号US7745869B2

    专利类型

  • 公开/公告日2010-06-29

    原文格式PDF

  • 申请/专利权人 YUKIO SAKASHITA;

    申请/专利号US20040542956

  • 发明设计人 YUKIO SAKASHITA;

    申请日2004-01-16

  • 分类号H01L27/108;H01L29/76;H01L29/94;H01L31/119;H01L29;

  • 国家 US

  • 入库时间 2022-08-21 18:48:58

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