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1-transistor type DRAM cell, a DRAM device and manufacturing method therefore, driving circuit for DRAM, and driving method therefor

机译:1-晶体管型DRAM单元,DRAM装置及其制造方法,DRAM的驱动电路及其驱动方法

摘要

The present invention relates to an 1-transistor DRAM cell, a DRAM device and a manufacturing method therefor, a driving circuit for a DRAM, a driving method therefore, and a driving method for an 1-transistor DRAM, and a double-gate type 1-transistor DRAM. The present invention comprises a data hold process biasing a word line at a negative voltage level and biasing a sensing line and a bit line at a first constant voltage level; a data purging process resetting data by biasing the word line and the bottom word line at a second constant voltage level and biasing the sensing line and the bit line at the first constant voltage level; and a data write process biasing the word line and the bottom word line at the second constant voltage level and supplying a write data to the bit line.
机译:1晶体管DRAM单元,DRAM装置及其制造方法,DRAM的驱动电路,因此的驱动方法以及1晶体管DRAM的驱动方法以及双栅型1晶体管DRAM。本发明包括数据保持过程,其将字线偏置为负电压电平并且将感测线和位线偏置为第一恒定电压电平。数据清除过程通过将字线和底字线偏置在第二恒定电压电平并且将感测线和位线偏置在第一恒定电压电平来重置数据;数据写入过程将字线和底字线偏置在第二恒定电压电平并将写入数据提供给位线。

著录项

  • 公开/公告号US7668008B2

    专利类型

  • 公开/公告日2010-02-23

    原文格式PDF

  • 申请/专利权人 HEE BOK KANG;

    申请/专利号US20070781421

  • 发明设计人 HEE BOK KANG;

    申请日2007-07-23

  • 分类号G11C11/34;

  • 国家 US

  • 入库时间 2022-08-21 18:48:48

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