首页> 外国专利> Method for manufacturing a connecting contact on a semiconductor device for power electronics and electronic component with a connecting contact on a semiconductor device manufactured in this way

Method for manufacturing a connecting contact on a semiconductor device for power electronics and electronic component with a connecting contact on a semiconductor device manufactured in this way

机译:在以这种方式制造的半导体器件上的连接触点上制造用于电力电子设备的半导体器件和电子部件上的连接触点的方法

摘要

The method involves welding a semiconductor component (1) with a contact element (2) by laser beam welding. The semiconductor component is soldered and sintered to a substrate at a lower side by a connecting layer (3). The semiconductor component is contacted with the contact element at an upper side by a laser welding connection (6) via a weldable metallic layer (5). The substrate is used as a direct copper bonded (DCB)-carrier substrate (4). The metallic layer is arranged at the upper side on the semiconductor component.
机译:该方法包括通过激光束焊接将半导体元件(1)与接触元件(2)焊接。通过连接层(3)将半导体部件焊接并烧结到下侧的基板上。半导体部件在上侧通过可焊接的金属层(5)通过激光焊接连接(6)与接触元件接触。该基板用作直接铜键合(DCB)载体基板(4)。金属层布置在半导体部件上的上侧。

著录项

  • 公开/公告号EP2144284A1

    专利类型

  • 公开/公告日2010-01-13

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号EP20080012612

  • 发明设计人 BIRNER MARTIN;WOELLMER HEINZ DR.;

    申请日2008-07-11

  • 分类号H01L21/60;

  • 国家 EP

  • 入库时间 2022-08-21 18:36:23

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