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vertical metal induction crystallization of the amorphous silicon thin film crystallized by this method , and a polycrystalline thin film transistor using the method

机译:通过该方法结晶的非晶硅薄膜的垂直金属感应结晶以及使用该方法的多晶薄膜晶体管

摘要

A method for crystallizing amorphous silicon thin film by metal induced vertical crystallization is provided to reduce a thermal process time and manufacturing time b crystallizing an amorphous silicon thin film layer. A first amorphous silicon layer is formed on a substrate(110), and a crystallization induction metal layer is formed on the first amorphous silicon layer. A first crystallization layer(125) used as a seed layer by crystallizing first amorphous silicon layer through a first thermal process. A second amorphous silicon layer is formed on the first crystallization layer, and a second crystallization layer is formed by crystallizing the second amorphous silicon layer through a metal induction vertical crystallization by using the first crystallization as the seed layer.
机译:提供一种通过金属诱导的垂直结晶来使非晶硅薄膜结晶的方法,以减少使非晶硅薄膜层结晶的热处理时间和制造时间。在衬底(110)上形成第一非晶硅层,并且在第一非晶硅层上形成结晶诱导金属层。通过第一热处理使第一非晶硅层结晶而用作种子层的第一结晶层(125)。在第一结晶层上形成第二非晶硅层,并且通过使用第一结晶作为籽晶层通过金属感应垂直结晶使第二非晶硅层结晶来形成第二结晶层。

著录项

  • 公开/公告号KR100929093B1

    专利类型

  • 公开/公告日2009-11-30

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070137608

  • 发明设计人 주승기;송남규;이상주;

    申请日2007-12-26

  • 分类号H01L29/786;H01L21/324;

  • 国家 KR

  • 入库时间 2022-08-21 18:33:43

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