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vertical metal induction crystallization of the amorphous silicon thin film crystallized by this method , and a polycrystalline thin film transistor using the method
vertical metal induction crystallization of the amorphous silicon thin film crystallized by this method , and a polycrystalline thin film transistor using the method
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机译:通过该方法结晶的非晶硅薄膜的垂直金属感应结晶以及使用该方法的多晶薄膜晶体管
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摘要
A method for crystallizing amorphous silicon thin film by metal induced vertical crystallization is provided to reduce a thermal process time and manufacturing time b crystallizing an amorphous silicon thin film layer. A first amorphous silicon layer is formed on a substrate(110), and a crystallization induction metal layer is formed on the first amorphous silicon layer. A first crystallization layer(125) used as a seed layer by crystallizing first amorphous silicon layer through a first thermal process. A second amorphous silicon layer is formed on the first crystallization layer, and a second crystallization layer is formed by crystallizing the second amorphous silicon layer through a metal induction vertical crystallization by using the first crystallization as the seed layer.
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