首页> 外国专利> ETCHING SOLUTION FOR SILICON WAFER CONTAINING A CHEMICAL ADDITIVE FOR LOWERING REDUCING POTENTIAL THROUGH REACTION WITH METALLIC ION

ETCHING SOLUTION FOR SILICON WAFER CONTAINING A CHEMICAL ADDITIVE FOR LOWERING REDUCING POTENTIAL THROUGH REACTION WITH METALLIC ION

机译:包含化学添加剂的硅晶片的蚀刻溶液,用于通过降低与金属离子的反应来降低电位

摘要

PURPOSE: An etching solution for silicon wafer is provided to reduce metal contamination on a silicon wafer and to perform the etching while not degrading the quality of the semiconductor wafer.;CONSTITUTION: An alkaline etching solution comprises chemical additives. The alkaline etching solution is NaOH or potassium hydroxide. The chemical additive is a chelating agent. The chelating agent is any one selected from EDTA, NTA, HEDTA, GEDTA, TTHA, HIDA, and DHEG. The chemical additive is added in 0.01 g/L ~ 0.4 g/L based on the alkaline etching solution.;COPYRIGHT KIPO 2010
机译:目的:提供一种用于硅晶片的蚀刻溶液,以减少硅晶片上的金属污染并在不降低半导体晶片质量的情况下进行蚀刻。;组成:碱性蚀刻溶液包含化学添加剂。碱性蚀刻溶液是NaOH或氢氧化钾。化学添加剂是螯合剂。螯合剂是选自EDTA,NTA,HEDTA,GEDTA,TTHA,HIDA和DHEG的任何一种。基于碱性蚀刻液,化学添加剂的添加量为0.01 g / L〜0.4 g / L。; COPYRIGHT KIPO 2010

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