首页> 外国专利> ALIGNMENT ERROR COMPENSATING METHOD OF ARRAY INKJET HEAD, WHICH CORRECTS THE ERROR OF THE SUBSCANNING DIRECTION OF HEAD CHIPS OF THE ARRAY INKJET PRINT HEAD

ALIGNMENT ERROR COMPENSATING METHOD OF ARRAY INKJET HEAD, WHICH CORRECTS THE ERROR OF THE SUBSCANNING DIRECTION OF HEAD CHIPS OF THE ARRAY INKJET PRINT HEAD

机译:校正喷墨打印头打印头的扫描方向误差的阵列喷墨头的对准误差补偿方法

摘要

PURPOSE: An alignment error compensating method of array inkjet head is provided to reduce manufacturing costs by alleviating the alignment accuracy of the head chip at the manufacturing process.;CONSTITUTION: An alignment error compensating method of array inkjet head(21,22) is as follows. The base head chip is decided. A plurality of reference lines of the main scanning direction is printed to be separated to the sub-scanning direction the reference gap by using the base head chip. A plurality of test lines offset about the reference gap the m times of the testing interval is printed by using the other head chips. The offset amount of the test line pitching is decided with the offset amount of each head chip. The step of deciding the offset amount of each head chip decides the offset amount of the test line with the opposite side offset amount of the head chip. The offset amount of the head chip which is in lead and sum total of the relative offset amount are decided with the offset amount of the corresponding head chip.;COPYRIGHT KIPO 2010
机译:目的:提供一种阵列喷墨头的对准误差补偿方法,通过在制造过程中降低头芯片的对准精度来降低制造成本。;组成:阵列喷墨头的对准误差补偿方法(21,22)如下。确定基本头芯片。通过使用基头芯片,将主扫描方向的多条基准线打印成与基准间隙在副扫描方向上分离。通过使用其他头芯片,打印多条测试线,这些测试线在参考间隙周围偏移了测试间隔的m倍。测试线间距的偏移量由每个头芯片的偏移量决定。决定每个头芯片的偏移量的步骤确定与头芯片的相对侧偏移量的测试线的偏移量。头芯片的偏移量和相对偏移量的总和取决于相应头芯片的偏移量。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100082217A

    专利类型

  • 公开/公告日2010-07-16

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20090001600

  • 发明设计人 CHO SEO HYUN;

    申请日2009-01-08

  • 分类号B41J29/393;B41J2/145;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:15

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