首页> 外国专利> PLASMA ETCHING APPARATUS FOR ETCHING A WAFER, CAPABLE OF ELIMINATING THIN FILM OR PARTICLES FORMED ON THE EDGE REGION OF A WAFER

PLASMA ETCHING APPARATUS FOR ETCHING A WAFER, CAPABLE OF ELIMINATING THIN FILM OR PARTICLES FORMED ON THE EDGE REGION OF A WAFER

机译:用于蚀刻晶片的等离子体蚀刻装置,能够消除在晶片边缘区域形成的薄膜或颗粒

摘要

PURPOSE: A plasma etching apparatus is provided to reduce a cost for installing facilities by regulating the etching rate of a wafer without the change of an etching machine.;CONSTITUTION: A gas distribution plate(250) divides and supplies reactive gas and non-reactive gas. A substrate supporting stand(240) is installed on the lower side of the gas distribution plate and supports the substrate. An upper electrode assembly(210) is installed on the outer peripheral part of the gas distribution plate and generates plasma. A lower electrode assembly(220) is installed on the outer peripheral part of the substrate supporting stand and generates plasma.;COPYRIGHT KIPO 2010
机译:目的:提供一种等离子刻蚀设备,以通过不改变刻蚀机的情况下调节晶片的刻蚀速率来降低安装设施的成本。组成:气体分配板(250)划分并供应反应性气体和非反应性气体加油站。基板支撑架(240)安装在气体分配板的下侧并支撑基板。上电极组件(210)安装在气体分配板的外周部分上并产生等离子体。下电极组件(220)安装在基板支撑架的外周部分上并产生等离子体。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100088769A

    专利类型

  • 公开/公告日2010-08-11

    原文格式PDF

  • 申请/专利权人 NURI SEMITECH CO. LTD.;

    申请/专利号KR20090007869

  • 发明设计人 KWON GI HYUN;

    申请日2009-02-02

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:09

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