首页> 外国专利> SEMICONDUCTOR DEVICE INCLUDING AN EMBEDDED GATE AND A METHOD FOR MANUFACTURING THE SAME, CAPABLE OF PREVENTING THE DETERIORATION OF THE EMBEDDED GATE WHICH IS CONTACT WITH AN ELEMENT ISOLATION FILM

SEMICONDUCTOR DEVICE INCLUDING AN EMBEDDED GATE AND A METHOD FOR MANUFACTURING THE SAME, CAPABLE OF PREVENTING THE DETERIORATION OF THE EMBEDDED GATE WHICH IS CONTACT WITH AN ELEMENT ISOLATION FILM

机译:包括嵌入式门的半导体装置及其制造方法,能够防止与元素隔离膜接触的嵌入式门的劣化

摘要

PURPOSE: A semiconductor device including an embedded gate and a method for manufacturing the same are provided to prevent the oxidation of the embedded gate generated during an interlayer insulating film formation process by forming an anti-oxidation film at a lower temperature than temperature at which the interlayer insulating film is formed.;CONSTITUTION: An active region(53) is defined by an element isolation film(52) in a semiconductor substrate(51). The active region and the element isolation film are etched to form a trench(55). An embedded gate(58) and the trench are partially embedded. An interlayer insulating film(60A) is formed on the embedded gate. An anti-oxidation film(57B) is formed between the embedded gate and the element isolation film.;COPYRIGHT KIPO 2011
机译:目的:提供一种包括嵌入式栅极的半导体器件及其制造方法,以通过在比形成半导体衬底时的温度低的温度下形成抗氧化膜来防止在层间绝缘膜形成过程中产生的嵌入式栅极的氧化。组成:有源区域(53)由半导体衬底(51)中的元件隔离膜(52)限定。蚀刻有源区和元件隔离膜以形成沟槽(55)。嵌入的栅极(58)和沟槽被部分地嵌入。在嵌入式栅极上形成层间绝缘膜(60A)。在嵌入式栅极和元件隔离膜之间形成抗氧化膜(57B)。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100094804A

    专利类型

  • 公开/公告日2010-08-27

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090013960

  • 发明设计人 HAN SANG YUP;

    申请日2009-02-19

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:00

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号