首页> 外国专利> METHOD FOR MANUFACTURING A NONVOLATILE MEMORY DEVICE, CAPABLE OF PREVENTING THE DEFORMATION OF A PATTERN BY SECURING MASKING MARGIN

METHOD FOR MANUFACTURING A NONVOLATILE MEMORY DEVICE, CAPABLE OF PREVENTING THE DEFORMATION OF A PATTERN BY SECURING MASKING MARGIN

机译:制造非易失性存储器的方法,该方法能够通过保证保证金来防止图案变形

摘要

PURPOSE: A method for manufacturing a nonvolatile memory device is provided to prevent the deterioration of sheet resistance of a floating gate by suppressing a top CD loss of the floating gate.;CONSTITUTION: A first conductive layer(303) for a floating gate is formed on the upper side of a substrate(301). A second conductive layer(305) for a control gate and a charge blocking layer are formed on a structure including the first conductive layer. An etching mask pattern(306) is formed on the second conductive layer. A passivation layer(307) is formed on the sidewall of the second conductive layer. The charge blocking layer and the first conductive layer are etched.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于制造非易失性存储器件的方法,以通过抑制浮置栅极的顶部CD损耗来防止浮置栅极的薄层电阻变差;组成:形成用于浮置栅极的第一导电层(303)在衬底(301)的上侧上。在包括第一导电层的结构上形成用于控制栅极的第二导电层(305)和电荷阻挡层。在第二导电层上形成蚀刻掩模图案(306)。钝化层(307)形成在第二导电层的侧壁上。蚀刻电荷阻挡层和第一导电层。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100108715A

    专利类型

  • 公开/公告日2010-10-08

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090026860

  • 发明设计人 KIM MYUNG OK;KIM TAE HYOUNG;

    申请日2009-03-30

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:47

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