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VERTICAL AlGaN/GaN-HEMT AND METHOD FOR MANUFACTURING THE SAME

机译:垂直AlGaN / GaN-HEMT及其制造方法

摘要

PROBLEM TO BE SOLVED: To provide a vertical AlGaN/GaN-HEMT for performing a sure normally-off operation, and to provide a method for manufacturing the same.;SOLUTION: The vertical AlGaN/GaN-HEMT includes: an SiN surface protective film 16 including an n-GaN buffer layer 12, a UID-GaN layer 13 and a UID-AlGaN layer 14 which are successively laminated on the surface of an n+-GaN substrate 11 and formed on the surface of the UID-AlGaN layer; an SiN first gate insulating film 18 for covering an opening of the surface protective film; an n-GaN aperture 20 embedded in an aperture forming recess 19; an SiN second gate insulating film 21 for covering at least a surface of the aperture which opposes the n+-GaN substrate and the first gate insulating film; a gate electrode 22 formed on the surface of the second gate insulating film in a first gate recess; source electrodes 23 formed so as to be separated to each other on the surface of the UID-AlGaN layer with the first gate recess sandwiched; and a drain electrode 24 formed on the surface of the n+-GaN substrate which opposes the UID-AlGaN layer.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供用于执行确定的常关操作的垂直AlGaN / GaN-HEMT,并提供其制造方法。解决方案:垂直AlGaN / GaN-HEMT包括:SiN表面保护膜如图16所示,包括n-GaN缓冲层12,UID-GaN层13和UID-AlGaN层14,它们依次层叠在n - -GaN衬底11的表面上并形成在该表面上所述UID-AlGaN层;覆盖表面保护膜的开口的SiN第一栅绝缘膜18;埋入孔形成凹部19中的n-GaN孔20; SiN第二栅绝缘膜21,其至少覆盖与n + -GaN衬底相对的开口的表面和第一栅绝缘膜;在第一栅凹槽中的第二栅绝缘膜的表面上形成的栅电极22;在UID-AlGaN层的表面上隔着第一栅极凹部而形成为彼此分离的源电极23。在与UID-AlGaN层相对的n + -GaN衬底的表面上形成漏电极24。版权所有:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2011210781A

    专利类型

  • 公开/公告日2011-10-20

    原文格式PDF

  • 申请/专利权人 OKI ELECTRIC INDUSTRY CO LTD;

    申请/专利号JP20100074557

  • 发明设计人 MARUI TOSHIHARU;TAMAI ISAO;

    申请日2010-03-29

  • 分类号H01L29/80;H01L21/338;H01L29/778;H01L29/812;H01L21/337;H01L29/808;

  • 国家 JP

  • 入库时间 2022-08-21 18:25:44

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