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RESISTANCE MEASUREMENT METHOD FOR CONDUCTIVE SHEET, APPARATUS USED FOR THE SAME, AND MANUFACTURING METHOD OF CONDUCTIVE SHEET USING THE SAME
RESISTANCE MEASUREMENT METHOD FOR CONDUCTIVE SHEET, APPARATUS USED FOR THE SAME, AND MANUFACTURING METHOD OF CONDUCTIVE SHEET USING THE SAME
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机译:导电片的电阻测量方法,用于该导电片的装置以及使用该导电片的导电片的制造方法
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摘要
PROBLEM TO BE SOLVED: To provide a method of accurately and swiftly measuring a resistance of a conductive sheet having on the surface thereof a conductive layer exposure region which includes multiple island-shaped exposure portions where the conductive layer is exposed in an island shape.;SOLUTION: A resistance measurement method is provided for a conductive layer of a conductive sheet 20 composed of the conductive layer and a resin layer formed on the surface of the conductive layer. The conductive sheet 20 has a conductive layer exposure region including multiple island-shaped exposure portions in each of which the conductive layer is exposed in an island shape on the surface of the resin layer. A pair of short-cylindrical probes 30 in each of which a strip electrode is formed on the circumferential surface of a short-cylindrical component continuously over the whole circumference, are used as probes for resistance measurement. The method comprises a step of scanning while bringing strip electrodes 25 of the pair of short-cylindrical probes 30 into pressure contact simultaneously on two points of the conductive layer exposure region spaced from each other. Moreover, a maximum height roughness Rz (JIS B0601:2001) of the surface of the strip electrodes 25 is within a range of 80-200% by taking the maximum height roughness Rz (JIS B0601:2001) of the surface of a conductive layer exposure region 13' as a reference.;COPYRIGHT: (C)2012,JPO&INPIT
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