首页> 外国专利> RESISTANCE MEASUREMENT METHOD FOR CONDUCTIVE SHEET, APPARATUS USED FOR THE SAME, AND MANUFACTURING METHOD OF CONDUCTIVE SHEET USING THE SAME

RESISTANCE MEASUREMENT METHOD FOR CONDUCTIVE SHEET, APPARATUS USED FOR THE SAME, AND MANUFACTURING METHOD OF CONDUCTIVE SHEET USING THE SAME

机译:导电片的电阻测量方法,用于该导电片的装置以及使用该导电片的导电片的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a method of accurately and swiftly measuring a resistance of a conductive sheet having on the surface thereof a conductive layer exposure region which includes multiple island-shaped exposure portions where the conductive layer is exposed in an island shape.;SOLUTION: A resistance measurement method is provided for a conductive layer of a conductive sheet 20 composed of the conductive layer and a resin layer formed on the surface of the conductive layer. The conductive sheet 20 has a conductive layer exposure region including multiple island-shaped exposure portions in each of which the conductive layer is exposed in an island shape on the surface of the resin layer. A pair of short-cylindrical probes 30 in each of which a strip electrode is formed on the circumferential surface of a short-cylindrical component continuously over the whole circumference, are used as probes for resistance measurement. The method comprises a step of scanning while bringing strip electrodes 25 of the pair of short-cylindrical probes 30 into pressure contact simultaneously on two points of the conductive layer exposure region spaced from each other. Moreover, a maximum height roughness Rz (JIS B0601:2001) of the surface of the strip electrodes 25 is within a range of 80-200% by taking the maximum height roughness Rz (JIS B0601:2001) of the surface of a conductive layer exposure region 13' as a reference.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种准确而快速地测量在其表面上具有导电层暴露区域的导电片的电阻的方法,该导电层暴露区域包括多个岛状暴露部分,其中该导电层以岛状暴露。解决方案:提供一种电阻测量方法,用于由导电层和形成在导电层表面上的树脂层组成的导电片20的导电层。导电片20具有包括多个岛状暴露部分的导电层暴露区域,其中,每个导电层以岛状暴露在树脂层的表面上。一对短圆柱探针30用作电阻测量探针,在短圆柱探针中,每个短圆柱探针在整个短圆周上连续地形成在短圆柱部件的圆周表面上。该方法包括扫描的步骤,同时使一对短圆柱状探针30的条形电极25同时在彼此间隔开的导电层暴露区域的两个点上压力接触。另外,通过取导电层的表面的最大高度粗糙度Rz(JIS B0601:2001),带状电极25的表面的最大高度粗糙度Rz(JIS B0601:2001)在80〜200%的范围内。曝光区域13'为参考。;版权:(C)2012,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011226903A

    专利类型

  • 公开/公告日2011-11-10

    原文格式PDF

  • 申请/专利权人 BRIDGESTONE CORP;

    申请/专利号JP20100096661

  • 发明设计人 AOKI SHIGERU;

    申请日2010-04-20

  • 分类号G01R27/02;H01B13/00;

  • 国家 JP

  • 入库时间 2022-08-21 18:24:35

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