首页> 外国专利> MINUTE SAMPLE STAND, SUBSTRATE FOR FORMING THE MINUTE SAMPLE STAND, METHOD FOR MANUFACTURING THE MINUTE SAMPLE STAND, AND ANALYZING METHOD USING THE MINUTE SAMPLE STAND

MINUTE SAMPLE STAND, SUBSTRATE FOR FORMING THE MINUTE SAMPLE STAND, METHOD FOR MANUFACTURING THE MINUTE SAMPLE STAND, AND ANALYZING METHOD USING THE MINUTE SAMPLE STAND

机译:细样样品架,形成细样样品架的基质,细样样品架的制造方法以及使用细样样品架的分析方法

摘要

PROBLEM TO BE SOLVED: To provide a minute sample stand capable of sharply reducing the background noise at analyses.;SOLUTION: The minute sample stand 100 has a minute sample loading membrane 20 formed to and integrated with one side of a minute sample stand base part 10 consisting of a semiconductor substrate. The minute sample stand base part 10 has a V-shaped groove 11, and the minute sample loading membrane 20 has the upper end surface 21, provided between the upper surface of the groove 11 and the deepest part of the groove 11. The part between the upper surface 13 of the minute sample stand base part 10 and the upper end surface 21 of the minute sample loading membrane 20 serves as the guard part of a minute sample 70.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种能够大大降低分析时背景噪声的微型样品台;解决方案:微型样品台100具有形成在微型样品台底座部分的一侧并与一体形成的微型样品加载膜20。图10是由半导体衬底组成的。微小样品台基部10具有V字状的槽11,微小样品装载膜20具有设置在槽11的上表面与槽11的最深部分之间的上端面21。微小样品台基部10的上表面13和微小样品装载膜20的上端面21作为微小样品70的保护部。版权所有:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010271101A

    专利类型

  • 公开/公告日2010-12-02

    原文格式PDF

  • 申请/专利权人 AOI ELECTRONICS CO LTD;

    申请/专利号JP20090121623

  • 发明设计人 IKEDA DAISUKE;

    申请日2009-05-20

  • 分类号G01N1/28;H01J37/20;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:41

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