首页> 外国专利> MINUTE SAMPLE STAND, SUBSTRATE USED FOR MANUFACTURING THE MINUTE SAMPLE STAND, METHOD FOR MANUFACTURING THE MINUTE SAMPLE STAND AND ANALYZING METHOD USING THE MINUTE SAMPLE STAND

MINUTE SAMPLE STAND, SUBSTRATE USED FOR MANUFACTURING THE MINUTE SAMPLE STAND, METHOD FOR MANUFACTURING THE MINUTE SAMPLE STAND AND ANALYZING METHOD USING THE MINUTE SAMPLE STAND

机译:微小样品台,用于制造微小样品台的基质,用于制造微小样品台的方法以及使用微小样品台的分析方法

摘要

PROBLEM TO BE SOLVED: To provide a minute sample stand capable of achieving the enhancement of productivity and easy to miniaturize.;SOLUTION: The minute sample stand 100 is formed of a silicon semiconductor substrate as a whole and a minute sample loader 20 is formed in the recess 11 of a minute sample stand base 10. Accordingly, the minute sample loader 20 is formed so as to become thinner than the minute sample stand base 10. Since a large number of the minute sample stands 100 can be manufactured from one semiconductor wafer, if separated from the semiconductor wafer, the enhancement of productivity can be achieved, and the miniaturization of the minute sample stand 100 becomes possible.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种能够实现生产率的提高并且易于小型化的微型样品台;解决方案:微型样品台100整体上由硅半导体衬底形成,并且微型样品装载器20形成在微型样品装载器20中。微型样品装载器20形成为比微型样品架子底座10更薄。由于可以由一个半导体晶片制造大量微型样品架子100。如果与半导体晶片分开,则可以提高生产率,并且可以使微型样品台100小型化。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011047660A

    专利类型

  • 公开/公告日2011-03-10

    原文格式PDF

  • 申请/专利权人 AOI ELECTRONICS CO LTD;

    申请/专利号JP20090193980

  • 发明设计人 IKEDA DAISUKE;

    申请日2009-08-25

  • 分类号G01N1/28;

  • 国家 JP

  • 入库时间 2022-08-21 18:22:18

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