首页> 外国专利> Penetrating completely the said semiconductor substrate to with the principal plane of aforementioned one side from the other principal plane

Penetrating completely the said semiconductor substrate to with the principal plane of aforementioned one side from the other principal plane

机译:所述半导体基板从另一主平面完全穿透至上述一侧的主平面。

摘要

PROBLEM TO BE SOLVED: To form a liquid ejection head including a semiconductor substrate with high precision.;SOLUTION: A semiconductor is fabricated in a silicon substrate 7 and a first wiring layer is formed to serve as a sacrifice layer partially. A silicon oxide film (interlayer insulating film) 13 is formed and a heater 3 is made by forming a heating resistor 14 and a second wiring layer 15. On the sacrifice layer, the second wiring layer 15 is removed to leave only the heating resistor 14. A protective silicon nitride film 16 and a cavitation resistant tantalum film 17 are formed and patterned. A resin substrate 2 is placed on a semiconductor substrate 1 and a supply opening 5 is formed by removing the sacrifice layer. The silicon oxide film 13 of a membrane film in the supply opening 5 is removed by wet etching. The heating resistor 14 serves as an etching stopper layer and the silicon nitride film 16 is not damaged. Remaining part of the membrane film, i.e. the heating resistor 14, and the silicon nitride film 16 are removed by dry etching to form a channel 4 and an ejection opening 6 in the resin substrate 2.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:形成包括半导体基板的高精度的液体喷射头。解决方案:在硅基板7中制造半导体,并且形成第一布线层以部分地用作牺牲层。形成氧化硅膜(层间绝缘膜)13,并通过形成加热电阻器14和第二布线层15来制造加热器3。在牺牲层上,去除第二布线层15而仅留下加热电阻器14形成并图案化保护性氮化硅膜16和抗气蚀钽膜17。将树脂基板2放置在半导体基板1上,并且通过去除牺牲层来形成供给开口5。通过湿蚀刻去除供给口5中的膜膜的氧化硅膜13。加热电阻器14用作蚀刻停止层,并且不会损坏氮化硅膜16。通过干法蚀刻除去膜膜的其余部分,即加热电阻器14和氮化硅膜16,以在树脂基板2中形成通道4和喷射开口6。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4731892B2

    专利类型

  • 公开/公告日2011-07-27

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20040344304

  • 发明设计人 早川 幸宏;

    申请日2004-11-29

  • 分类号B41J2/16;B41J2/05;

  • 国家 JP

  • 入库时间 2022-08-21 18:20:34

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