首页> 外国专利> The optical axis deflection die laser interferometer, the proofreading manner, amendment manner, and the standard sphere which

The optical axis deflection die laser interferometer, the proofreading manner, amendment manner, and the standard sphere which

机译:光轴偏转模具激光干涉仪,校对方式,修正方式和标准范围

摘要

PROBLEM TO BE SOLVED: To calibrate a displacement gage for correcting the errors of an optical axis direction due to motion precision of a two-axis rotation mechanism to a reference sphere of an optical axis deviation type laser interferometer without preparing specific calibration device to secure traceability.;SOLUTION: The optical axis deviation type laser interferometer has the reference sphere 34 of measurement, a recursive reflection means 12 arranged on a measuring object 10, a laser interference length measuring machine 20 for measuring a distance with the recursive reflection means 12 and the rotation mechanism 30 for rotating the reference sphere 34 as a center. The interferometer regards a center coordinate of the reference sphere 34 as a reference and measures the distance with the recursive reflection means 12 in which optical axes of emission light from the laser interference length measuring machine 20 mounted on the rotation mechanism 30 and return light are parallel. The interferometer is provided with the displacement gages 50R and 50L for measuring errors due to relative motion of the reference sphere 34 and the laser interference length measuring machine 20 and a mechanism 52 for being displaced in a direction of the measurement optical axis to the reference sphere 34 as the relative position relationship of the laser interference length measuring machine 20 and the displacement gages 50R and 50L are held.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:校正位移计以校正由于两轴旋转机构相对于光轴偏移型激光干涉仪的参考球的运动精度而引起的光轴方向误差,而无需准备用于确保可追溯性的专用校正装置解决方案:光轴偏移型激光干涉仪具有测量的参考球体34,布置在测量对象10上的递归反射装置12,用于与递归反射装置12测量距离的激光干涉长度测量机20和旋转机构30,其以基准球34为中心旋转。干涉仪将基准球34的中心坐标作为基准,并与递归反射装置12测量距离,其中安装在旋转机构30上的激光干涉长度测量机20的发射光和返回光的光轴平行。 。干涉仪具有用于测量由于参考球34和激光干涉长度测量机20的相对运动引起的误差的位移计50R和50L,以及用于在测量光轴方向上相对于参考球的方向上位移的机构52。作为激光干涉长度测量机20与位移计50R和50L的相对位置关系,图34被保持。版权所有:(C)2008,日本国际专利商标局

著录项

  • 公开/公告号JP4776473B2

    专利类型

  • 公开/公告日2011-09-21

    原文格式PDF

  • 申请/专利权人 株式会社ミツトヨ;

    申请/专利号JP20060229164

  • 发明设计人 阿部 誠;上島 泰;武富 尚之;

    申请日2006-08-25

  • 分类号G01B9/02;G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-21 18:20:24

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