首页> 外国专利> Using the energy distributed x-ray analytical instrument which is installed in the scanning-type electron microscope in order to measure the mannered

Using the energy distributed x-ray analytical instrument which is installed in the scanning-type electron microscope in order to measure the mannered

机译:使用安装在扫描型电子显微镜中的能量分布x射线分析仪来测量

摘要

PPROBLEM TO BE SOLVED: To provide a method for measuring the distribution density of detected components on the cross section of solid material for measurement. PSOLUTION: The method for measuring the distribution density of detected components on the cross section of solid material for measurement comprises a process for preparing a plurality of calibration curve formation samples with varying densities of detected components by mixing and molding powder samples and detected components in powder form at varying densities, the powder samples containing no detected components; a process for measuring the X-ray intensities of specific elements in the detected components of each of the calibration curve formation samples; a process for creating calibration curves about the measurements of the specific elements in the detected components based on the densities of the detected components in each of the samples and on the X-ray intensities; and a process for measuring the distribution densities of the detected components on the cross section of the solid material for measurement by measuring the X-ray intensities of the specific elements in the detected components at each position on a certain straight line on the cross section of the solid material for measurement, and converting the X-ray intensities into the densities of the detected components by means of the calibration curves. PCOPYRIGHT: (C)2007,JPO&INPIT
机译:

要解决的问题:提供一种用于测量要测量的固体材料横截面上被检测成分分布密度的方法。

解决方案:用于测量所测量的固体材料的横截面上的被检测成分的分布密度的方法包括以下步骤:通过混合和模制粉末样本和被检测样本,制备具有不同检测成分密度的多个校准曲线形成样本。不同密度的粉末状成分,粉末样品中未检测到成分;测量每个校准曲线形成样本的检测成分中特定元素的X射线强度的过程;用于基于每个样本中的被检测成分的密度和X射线强度来创建关于被检测成分中特定元素的测量值的校准曲线的过程;通过在测量的固体材料的横截面上的某一直线上的每个位置处测量被检测成分中特定元素的X射线强度,来测量被测固体材料横截面上被检测成分的分布密度的方法。用于测量的固体材料,并通过校准曲线将X射线强度转换为检测到的成分的密度。

版权:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP4611931B2

    专利类型

  • 公开/公告日2011-01-12

    原文格式PDF

  • 申请/专利权人 ハウス食品株式会社;

    申请/专利号JP20060134346

  • 发明设计人 野口 憲太郎;

    申请日2006-05-12

  • 分类号G01N23/225;A23L1/16;

  • 国家 JP

  • 入库时间 2022-08-21 18:19:39

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