首页> 外国专利> Irradiating the energy distributed x-ray detection device and the scanning-type electron microscope and the electronic beam microanalyser null

Irradiating the energy distributed x-ray detection device and the scanning-type electron microscope and the electronic beam microanalyser null

机译:辐照能量分布的X射线检测装置及扫描型电子显微镜和电子束显微分析仪

摘要

PROBLEM TO BE SOLVED: To provide an energy dispersion type X-ray detection device having excellent vibration proofness and provided with a detecting part with a high low-noise decomposition function in a low cost. SOLUTION: An electrode 2, to which a semiconductor X-ray detection element 1 and a high-voltage wire 8 are connected via a slit opening 10, is included in an insulator 3, which is stored in an element holder 4. A finger body 6 with high thermal conductivity coupled with a cold finger 7 contains a first stage FET 11, a gate electrode 13 connected to the gate and provided on the end face, and a substrate 5 provided with a heater resistance 12 mounted thereon and a FET wiring 9 for sending and receiving signals to and from outside. By fastening a female screw of the element holder 4 and a male screw 14 of the finger body to each other, the semiconductor X-ray detection element 1 is fixed with the electrode 2 and the gate electrode 13 sandwiching it.
机译:解决的问题:提供一种能量散射型X射线检测装置,其具有优异的耐振动性并且以低成本提供具有高低噪声分解功能的检测部。解决方案:绝缘体3中包含一个电极2,该电极2通过狭缝开口10与半导体X射线检测元件1和高压线8连接,该电极2存储在元件支架4中。具有高热导率的图6与冷指7耦合,包括第一级FET 11,连接至栅极并设置在端面上的栅电极13,以及在其上安装有加热器电阻12的基板5和FET布线9用于向外部发送和接收信号。通过将元件保持件4的内螺纹和手指主体的外螺纹14彼此紧固,半导体X射线检测元件1被电极2和栅电极13夹持而固定。

著录项

  • 公开/公告号JP3890883B2

    专利类型

  • 公开/公告日2007-03-07

    原文格式PDF

  • 申请/专利权人 株式会社島津製作所;

    申请/专利号JP20000367871

  • 发明设计人 小河 潔;井上 信治;

    申请日2000-12-04

  • 分类号G01T7/00;G01N23/223;G01N23/225;G01T1/24;G01T1/36;G21K7/00;H01L31/09;H01L31/02;

  • 国家 JP

  • 入库时间 2022-08-21 21:07:35

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