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Bias sputtering device and bias sputtering method

机译:偏压溅射装置及偏压溅射方法

摘要

PROBLEM TO BE SOLVED: To normally apply bias voltage to a substrate even when sputtering is repeated many times in the sputtering for depositing a conductive film while applying the bias voltage to the substrate.;SOLUTION: Gas such as argon is introduced in a sputter chamber 1 by a gas introducing system 2, voltage is applied from a sputter power source 4 to a target 3 formed of a conductive material to generate sputter discharge while holding the substrate 9 by a substrate holder 5. Sputter particles emitted from the target 3 reach the substrate 9 to deposit the conductive film. The bias voltage is applied to the substrate 9 by a bias power source 52. The substrate holder 5 has a holder shield 53 diagonally behind a substrate holding surface as a member of grounding electric potential, and a recess 54 for preventing film continuation so that a deposit film 501 on the surface of the holder shield 53 is not continuous to a deposit film 504 of the substrate holding surface. The substrate holding surface is smaller than the substrate 9, and the sputter particles on the recess 54 for preventing film continuation are shielded by a peripheral portion of the substrate 9 projected from the substrate holding surface.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:即使在溅射过程中重复多次溅射以沉积导电膜的同时向衬底上施加偏压,通常也要向衬底上施加偏压;解决方案:将诸如氩气的气体引入溅射室如图1所示,通过气体引入系统2,从溅射电源4向由导电材料形成的靶3施加电压,以在通过基板支架5保持基板9的同时产生溅射放电。从靶3发射的溅射粒子到达衬底9以沉积导电膜。通过偏置电源52将偏置电压施加到基板9。基板保持器5具有在基板保持表面对角后方的作为接地电势的部件的保持器屏蔽件53,以及用于防止膜连续的凹部54,以便支架护罩53的表面上的沉积膜501与基板保持表面的沉积膜504不连续。基板保持表面小于基板9,并且用于防止膜连续的凹部54上的溅射粒子被从基板保持表面突出的基板9的周边部分屏蔽。;版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP4673478B2

    专利类型

  • 公开/公告日2011-04-20

    原文格式PDF

  • 申请/专利权人 キヤノンアネルバ株式会社;

    申请/专利号JP20000306881

  • 发明设计人 小林 正彦;

    申请日2000-10-05

  • 分类号C23C14/34;C23C14/44;H01L21/203;H01L21/285;

  • 国家 JP

  • 入库时间 2022-08-21 18:17:50

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